Reed, S. J. B. (2005) Electron microprobe analysis and scanning electron microscopy in geology. Cambridge University Press, Cambridge. ISBN 9780521848756Full text not available from this repository.
This book describes electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. No prior knowledge is assumed and unnecessary technical detail is avoided, in order to keep the book easily accessible to new users of these techniques. The principles of electron–specimen interactions and instrumentation are covered in the first part of the book. The mechanisms involved in SEM (secondary and backscattered electron) image formation are then explained, with full consideration of digital imaging techniques. The operating principles of energy- and wavelength-dispersive X-ray spectrometers are described, as well as ancillary techniques including cathodoluminescence (CL) and electron backscatter diffraction (EBSD). Procedures for qualitative and quantitative X-ray analysis (using either electron microprobe or SEM instruments) are described in detail. The production of X-ray ‘maps’ showing element distributions is also described, with examples. Finally the subject of specimen preparation is discussed. There is an emphasis throughout on specifically geological aspects not covered in books aimed at a more general readership. This updated version of the first (1996) edition takes full account of recent developments and is intended for geological graduate students and postdoctoral workers, as well as those in commercial laboratories. It is also an invaluable accompaniment to courses for geological EMPA and SEM users.
|Uncontrolled Keywords:||08AREP IA55|
|Subjects:||05 - Petrology - Igneous, Metamorphic and Volcanic Studies|
|Divisions:||05 - Petrology - Igneous, Metamorphic and Volcanic Studies|
|Depositing User:||Sarah Humbert|
|Date Deposited:||25 Nov 2011 15:32|
|Last Modified:||23 Jul 2013 09:57|
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