Lou, X. J. and Hu, X. B. and Zhang, M. and Redfern, S. A. T. and Scott, J. F. (2005) Mechanisms of nano-shorts in the electrical breakdown of ferroelectric thin films. Integrated Ferroelectrics, 73 (1). pp. 93-98. DOI 10.1080/10584580500413772Full text not available from this repository.
Micro-Raman, SEM and electron nano-probe techniques are used to show that bismuth titanate thin films undergoes a local phase transformation from layered-perovskite structure to pyrochlore-like structure during filamentary electrical breakdown, with the loss of Bi and oxygen. In PZT, dendrite-like structures (precursors of electrical shorts) of a few microns diameter, produced by bipolar voltage cycling (i.e. fatigue), exhibit almost pure regions of agr -PbO, β -PbO and rutile-TiO2. Note that β -PbO is not the stable ambient phase.
|Uncontrolled Keywords:||2006 AREP 2005 P IA50|
|Subjects:||03 - Mineral Sciences|
|Divisions:||03 - Mineral Sciences|
|Journal or Publication Title:||Integrated Ferroelectrics|
|Page Range:||pp. 93-98|
|Depositing User:||Sarah Humbert|
|Date Deposited:||31 May 2011 10:09|
|Last Modified:||23 Jul 2013 09:59|
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