Mechanisms of nano-shorts in the electrical breakdown of ferroelectric thin films

Lou, X. J. and Hu, X. B. and Zhang, M. and Redfern, S. A. T. and Scott, J. F. (2005) Mechanisms of nano-shorts in the electrical breakdown of ferroelectric thin films. Integrated Ferroelectrics, 73 (1). pp. 93-98. DOI 10.1080/10584580500413772

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Abstract

Micro-Raman, SEM and electron nano-probe techniques are used to show that bismuth titanate thin films undergoes a local phase transformation from layered-perovskite structure to pyrochlore-like structure during filamentary electrical breakdown, with the loss of Bi and oxygen. In PZT, dendrite-like structures (precursors of electrical shorts) of a few microns diameter, produced by bipolar voltage cycling (i.e. fatigue), exhibit almost pure regions of agr -PbO, β -PbO and rutile-TiO2. Note that β -PbO is not the stable ambient phase.

Item Type: Article
Uncontrolled Keywords: 2006 AREP 2005 P IA50
Subjects: 03 - Mineral Sciences
Divisions: 03 - Mineral Sciences
Journal or Publication Title: Integrated Ferroelectrics
Volume: 73
Page Range: pp. 93-98
Identification Number: 10.1080/10584580500413772
Depositing User: Sarah Humbert
Date Deposited: 31 May 2011 10:09
Last Modified: 23 Jul 2013 09:59
URI: http://eprints.esc.cam.ac.uk/id/eprint/1730

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