Tucker, M. G. and Keen, D. A. and Dove, M. T. and Trachenko, K. (2005) Refinement of the Si-O-Si bond angle distribution in vitreous silica. Journal of Physics: Condensed Matter, 17. S67-S75. DOI 10.1088/0953-8984/17/5/008Full text not available from this repository.
A model of silica glass consisting of a fully connected corner-sharing network of SiO4 tetrahedra is refined using neutron diffraction data and reverse Monte Carlomodelling. Thismodel is then used to investigate optimal inter-tetrahedral Si–O–Si bond angle distributions. The distribution which is most consistent with the data is found to be centred around θSi−O−Si = 151.0◦ with a standard deviation of between 9◦ and 12◦. Other recent determinations of the Si–O–Si bond angle distribution are in good agreement with this result.
|Uncontrolled Keywords:||2005 AREP 2005 P IA48|
|Subjects:||03 - Mineral Sciences|
|Divisions:||03 - Mineral Sciences|
|Journal or Publication Title:||Journal of Physics: Condensed Matter|
|Depositing User:||Sarah Humbert|
|Date Deposited:||13 Aug 2010 10:50|
|Last Modified:||23 Jul 2013 09:59|
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