Refinement of the Si-O-Si bond angle distribution in vitreous silica.

Tucker, M. G. and Keen, D. A. and Dove, M. T. and Trachenko, K. (2005) Refinement of the Si-O-Si bond angle distribution in vitreous silica. Journal of Physics: Condensed Matter, 17. S67-S75. DOI 10.1088/0953-8984/17/5/008

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Abstract

A model of silica glass consisting of a fully connected corner-sharing network of SiO4 tetrahedra is refined using neutron diffraction data and reverse Monte Carlomodelling. Thismodel is then used to investigate optimal inter-tetrahedral Si–O–Si bond angle distributions. The distribution which is most consistent with the data is found to be centred around θSi−O−Si = 151.0◦ with a standard deviation of between 9◦ and 12◦. Other recent determinations of the Si–O–Si bond angle distribution are in good agreement with this result.

Item Type: Article
Uncontrolled Keywords: 2005 AREP 2005 P IA48
Subjects: 03 - Mineral Sciences
Divisions: 03 - Mineral Sciences
Journal or Publication Title: Journal of Physics: Condensed Matter
Volume: 17
Page Range: S67-S75
Identification Number: 10.1088/0953-8984/17/5/008
Depositing User: Sarah Humbert
Date Deposited: 13 Aug 2010 10:50
Last Modified: 23 Jul 2013 09:59
URI: http://eprints.esc.cam.ac.uk/id/eprint/1855

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