Atomic force microscopy: Pinning down the thickness of twin walls

Salje, E. K. H. and Lee, W. T. (2004) Atomic force microscopy: Pinning down the thickness of twin walls. Nature Materials, 3 (7). pp. 425-426. DOI 10.1038/nmat1170

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Abstract

The interaction of twin walls with defects influences many of the properties of ferroelectric and superconducting materials. A breakthrough in experimental methods allows the direct determination of twin-wall widths for the first time.

Item Type:	Article
Subjects:	03 - Mineral Sciences
Divisions:	03 - Mineral Sciences
Journal or Publication Title:	Nature Materials
Volume:	3
Page Range:	pp. 425-426
Identification Number:	10.1038/nmat1170
Depositing User:	Sarah Humbert
Date Deposited:	20 Jun 2012 08:34
Last Modified:	23 Jul 2013 10:04
URI:	http://eprints.esc.cam.ac.uk/id/eprint/2537

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