Salje, E. K. H. and Lee, W. T. (2004) Atomic force microscopy: Pinning down the thickness of twin walls. Nature Materials, 3 (7). pp. 425-426. DOI https://doi.org/10.1038/nmat1170
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Official URL: http://www.nature.com/nmat/journal/v3/n7/full/nmat...
Abstract
The interaction of twin walls with defects influences many of the properties of ferroelectric and superconducting materials. A breakthrough in experimental methods allows the direct determination of twin-wall widths for the first time.
Item Type: | Article |
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Subjects: | 03 - Mineral Sciences |
Divisions: | 03 - Mineral Sciences |
Journal or Publication Title: | Nature Materials |
Volume: | 3 |
Page Range: | pp. 425-426 |
Identification Number: | https://doi.org/10.1038/nmat1170 |
Depositing User: | Sarah Humbert |
Date Deposited: | 20 Jun 2012 08:34 |
Last Modified: | 23 Jul 2013 10:04 |
URI: | http://eprints.esc.cam.ac.uk/id/eprint/2537 |
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