Kumar, A. and Murari, N. M. and Katiyar, R. S. and Scott, J. F. (2007) Probing the ferroelectric phase transition through Raman spectroscopy in Pb(Fe~2~/~3W~1~/~3)~1~/~2Ti~1~/~2O~3 thin films (3 pages). Applied Physics Letters, 90. p. 262907. DOI https://doi.org/10.1063/1.2752535
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Abstract
The present work investigates the evolution of micro-Raman spectra of (1−x)Pb(Fe2/3W1/3)O3−xPbTiO3 (PFWT) (x=0.50) thin films in the temperature range from 80 to 600 K. Raman and dielectric data indicate that the crystal structure changes from tetragonal to cubic, i.e., a ferroelectric phase transition at 575 K. The dielectric properties of PFWT thin films were studied in the temperature range of 80–600 K over a wide range of frequencies. The slope of the reciprocal of the dielectric constant is 2:1, matched well with the simplest Landau free energy model, and it indicates a continuous second order displacive ferroelectric phase transition. ©2007 American Institute of Physics
Item Type: | Article |
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Uncontrolled Keywords: | 2007 AREP 2007 P IA54 |
Subjects: | 03 - Mineral Sciences |
Divisions: | 03 - Mineral Sciences |
Journal or Publication Title: | Applied Physics Letters |
Volume: | 90 |
Page Range: | p. 262907 |
Identification Number: | https://doi.org/10.1063/1.2752535 |
Depositing User: | Sarah Humbert |
Date Deposited: | 16 Feb 2009 13:02 |
Last Modified: | 23 Jul 2013 10:07 |
URI: | http://eprints.esc.cam.ac.uk/id/eprint/460 |
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