Dependence of breakdown field on dielectric (interelectrode) thickness in base-metal electroded multilayer capacitors (3 pages)

Milliken, A. D. and Bell, A. J. and Scott, J. F. (2007) Dependence of breakdown field on dielectric (interelectrode) thickness in base-metal electroded multilayer capacitors (3 pages). Applied Physics Letters, 90. p. 112910. DOI 10.1063/1.2713780

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Abstract

The authors have empirically determined the dependence of breakdown field EB versus dielectric thickness d (electrode separation) for a large number (4100) of BaTiO3-based multilayer capacitors with Ni base-metal electrodes. The data averaged over lateral area show for 6<d<22 µm that EB=const×d−n, where n=0.50±0.06, a result compatible with macroscopic “thermal” dc breakdown mechanisms. More precisely, however, the results nearly perfectly fit a situation of breakdown occurring in connected defects from collision ionization resulting from field emission from the cathode.

Item Type: Article
Uncontrolled Keywords: 2007 AREP IA54 2007 P
Subjects: 03 - Mineral Sciences
Divisions: 03 - Mineral Sciences
Journal or Publication Title: Applied Physics Letters
Volume: 90
Page Range: p. 112910
Identification Number: 10.1063/1.2713780
Depositing User: Sarah Humbert
Date Deposited: 16 Feb 2009 13:03
Last Modified: 23 Jul 2013 10:07
URI: http://eprints.esc.cam.ac.uk/id/eprint/539

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