Electrical characteristics of PbZr(0.4)Ti(0.6)O3 capacitors

Zubko, P. and Jung, D. J. and Scott, J. F. (2006) Electrical characteristics of PbZr(0.4)Ti(0.6)O3 capacitors. Journal of Applied Physics, 100. p. 114113. DOI https://doi.org/10.1063/1.2382479

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We have conducted a careful study of current-voltage (I-V) characteristics in fully integrated commercial PbZr0.4Ti0.6O3 thin-film capacitors with Pt bottom and Ir/IrO2 top electrodes. Highly reproducible steady-state I-V were obtained at various temperatures over two decades in voltage from current-time data and analyzed in terms of several common transport models including space charge limited conduction, Schottky thermionic emission under full and partial depletion, and Poole-Frenkel conduction, showing that the latter is the most plausible leakage mechanism in these high-quality films. In addition, ferroelectric hysteresis loops and capacitance-voltage data were obtained over a large range of temperatures and discussed in terms of a modified Landau-Ginzburg-Devonshire theory accounting for space charge effects

Item Type: Article
Uncontrolled Keywords: 2006 AREP IA52 2006 P
Subjects: 03 - Mineral Sciences
Divisions: 03 - Mineral Sciences
Journal or Publication Title: Journal of Applied Physics
Volume: 100
Page Range: p. 114113
Identification Number: https://doi.org/10.1063/1.2382479
Depositing User: Sarah Humbert
Date Deposited: 16 Feb 2009 13:04
Last Modified: 23 Jul 2013 09:54
URI: http://eprints.esc.cam.ac.uk/id/eprint/844

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