 | Up a level |
Popel, Aleksej J. and Tan, Beng Thye and Gouder, Thomas and Lampronti, Giulio I. and Day, Jason and Eloirdi, Rachel and Seibert, Alice and Farnan, Ian (2019) Surface alteration evidence for a mechanism of anoxic dissolution of UO2. Applied Surface Science, 464. pp. 376-379. ISSN 0169-4332 DOI https://doi.org/10.1016/j.apsusc.2018.09.094
Maslakov, Konstantin I. and Teterin, Yury A. and Popel, Aleksej J. and Yu. Teterin, Anton and Ivanov, Kirill E. and Kalmykov, Stepan N. and Petrov, Vladimir G. and Petrov, Peter K. and Farnan, Ian (2018) XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples. Applied Surface Science. ISSN 0169-4332 DOI https://doi.org/10.1016/j.apsusc.2018.04.077 (In Press)
Popel, A. J. and Le Solliec, S. and Lampronti, G. I. and Day, J. and Petrov, P. K. and Farnan, I. (2017) The effect of fission-energy Xe ion irradiation on the structural integrity and dissolution of the CeO2 matrix. Journal of Nuclear Materials, 484. pp. 332-338. ISSN 00223115 DOI https://doi.org/10.1016/j.jnucmat.2016.10.046
Popel, A. J. and Adamska, A.M. and Martin, P.G. and Payton, O.D. and Lampronti, G. I. and Picco, L. and Payne, L. and Springell, R. and Scott, T.B. and Monnet, I. and Grygiel, C. and Farnan, I. (2016) Structural effects in UO2 thin films irradiated with U ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 386. pp. 8-15. ISSN 0168583X DOI https://doi.org/10.1016/j.nimb.2016.09.019
Popel, A. J. and Lebedev, V.A. and Martin, P.G. and Shiryaev, A.A. and Lampronti, G. I. and Springell, R. and Kalmykov, S.N. and Scott, T.B. and Monnet, I. and Grygiel, C. and Farnan, I. (2016) Structural effects in UO2 thin films irradiated with fission-energy Xe ions. Journal of Nuclear Materials, 482. pp. 210-217. ISSN 0022-3115 DOI https://doi.org/10.1016/j.jnucmat.2016.10.024
Teterin, Yuri A. and Popel, Aleksej J. and Maslakov, Konstantin I. and Teterin, Anton Yu. and Ivanov, Kirill E. and Kalmykov, Stepan N. and Springell, Ross and Scott, Thomas B. and Farnan, Ian (2016) XPS Study of Ion Irradiated and Unirradiated UO2 Thin Films. Inorganic Chemistry. ISSN 0020-1669, ESSN: 1520-510X
