Lou, X. J. and Hu, X. B. and Zhang, M. and Redfern, S. A. T. and Scott, J. F. (2005) Mechanisms of nano-shorts in the electrical breakdown of ferroelectric thin films. Integrated Ferroelectrics, 73 (1). pp. 93-98. DOI https://doi.org/10.1080/10584580500413772
Full text not available from this repository.Abstract
Micro-Raman, SEM and electron nano-probe techniques are used to show that bismuth titanate thin films undergoes a local phase transformation from layered-perovskite structure to pyrochlore-like structure during filamentary electrical breakdown, with the loss of Bi and oxygen. In PZT, dendrite-like structures (precursors of electrical shorts) of a few microns diameter, produced by bipolar voltage cycling (i.e. fatigue), exhibit almost pure regions of agr -PbO, β -PbO and rutile-TiO2. Note that β -PbO is not the stable ambient phase.
Item Type: | Article |
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Uncontrolled Keywords: | 2006 AREP 2005 P IA50 |
Subjects: | 03 - Mineral Sciences |
Divisions: | 03 - Mineral Sciences |
Journal or Publication Title: | Integrated Ferroelectrics |
Volume: | 73 |
Page Range: | pp. 93-98 |
Identification Number: | https://doi.org/10.1080/10584580500413772 |
Depositing User: | Sarah Humbert |
Date Deposited: | 31 May 2011 10:09 |
Last Modified: | 23 Jul 2013 09:59 |
URI: | http://eprints.esc.cam.ac.uk/id/eprint/1730 |
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