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2020

Ball, Matthew R. and Taylor, Richard J. M. and Einsle, Joshua F and Khanom, Fouzia and Guillermier, Christelle and Harrison, Richard J. (2020) Helium ion microscope – secondary ion mass spectrometry for geological materials. Beilstein Journal of Nanotechnology, 11. pp. 1504-1515. ISSN 2190-4286 DOI https://doi.org/10.3762/bjnano.11.133

This list was generated on Sun Jun 13 12:05:36 2021 BST.

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